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반도체검사장비개발

Semiconductor Thermal shock Cycle Test Equipment

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제품요약 System for measuring the variation that occurs when power device repeats high and low temperature for a long time

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  • USE

  1. ​​System for measuring the variation that occurs when power device repeats high and low temperature for a long time, which being a very important factor in the thermal design of the packag
  2. Extensive use in applications from the development phase of the power device using H / W and Labview S / W of the high performance
     
  • Performance & Features

  1. IPM simultaneous testing of internal and external control
  2. P / S, V / I sensor for IGBT current supply
  3. Reduction of the noise by constructing a SW Module closest to the DUT
  4. Powerful and efficient cooling (air-cooled) System Applicatio
  5. Simultaneous or independent testing of multi-channel power semiconductors (IGBT, FET, etc.) 
     
  • Equipment Under Test (EUT)


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